Quantitative Convergent Beam Electron Diffraction
نویسندگان
چکیده
منابع مشابه
Convergent beam electron diffraction
In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from t...
متن کاملConvergent beam electron diffraction
The development of new materials requires an understanding of their mode of growth and the nature of defects, interfaces and strains thereby incorporated. This paper shows how convergent beam electron diffraction (CBED) and large angle CBED (LACBED) can be used to analyse such problems. It is shown how CBED and LACBED can give two-beam rocking curves, which can be used to profile plane rotation...
متن کاملRecent Advances in Quantitative Convergent Beam Electron Diffraction
Two recent advances in quantitative convergent beam electron diffraction (CBED) developed at the University of Bristol are described in this paper. The first is a new scanning technique in which the diffracted intensities in the resulting pattern are integrated through the Bragg condition, equivalent to precessing the sample around a stationary beam. Many more reflections are excited than in a ...
متن کاملPractical phase identification by convergent beam electron diffraction.
The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by...
متن کاملQuantitative Energy-filtered Convergent Beam Electron Diffraction - Matching Theory to Experiment
Quantitative Convergent Beam Electron Diffraction (CBED) is now established as a means of accurate loworder structure factor determination. Using energy-filtered zone-axis CBED patterns it has been demonstrated that the 111 structure factor at the <110> zone-axis in Si can be measured to better than 0.1%. In order to achieve this accuracy, it is essential to have a full understanding of the zon...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2002
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927602101966